Download Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

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Book Details :
Published on: 2013-11-16
Released on:
Original language: English

This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable. Design-for-Test and Test Optimization Techniques for TSV ... Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs [Brandon Noia Krishnendu Chakrabarty] ... ProQuest Document View - Design-for-Test and Test ... Design-for-Test and Test Optimization Techniques for TSV-based 3D ... and 3D stacked ICs (3D SICs) ... offer greater design flexibility over 2D ICs ... Design-for-test and test optimization techniques for TSV ... Design-for-test and test optimization techniques for TSV-based 3D ... design test scheduling and optimization. ... techniques for TSV-based 3D stacked ICs ... Design-for-Test and Test Optimization Techniques for TSV ... Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. ... Test-Architecture Optimization ... Test Optimization Techniques for TSV-based 3D ... Design-for-Test and Test Optimization Techniques for TSV ... Design-for-Test and Test Optimization Techniques for TSV-based 3D ... design test scheduling and optimization. ... Techniques for TSV-based 3D Stacked ICs : Design-for-Test and Test Optimization Techniques for TSV ... Read Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs by Brandon Noia with Kobo. ... With the purchase of Kobo VIP Membership ... Design-for-Test and Test Optimization Techniques for TSV ... Read Design-for-Test and Test Optimization Techniques for TSV-based 3D ... Techniques for TSV-based 3D Stacked ICs. ... Design-for-Test and Test Optimization ... Design-for-Test and Test Optimization Techniques for TSV ... Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. ... Optimization Techniques for TSV-based 3D Stacked ICs ... common design-for-test ... Design-for-Test and Test Optimization Techniques for TSV ... Design-for-Test and Test Optimization Techniques for TSV-based 3D ... and 3D stacked ICs (3D ... but they can offer greater design. flexibility over 2D ICs ... Design-for-Test and Test Optimization Techniques for TSV ... Design-for-Test and Test Optimization Techniques for TSV-based 3D ... Techniques for TSV-based 3D Stacked ICs by ... and design-for-test (DFT) of 3D ...
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